I-DB-FIB
Isingeniso Sesevisi
Njengamanje, i-DB-FIB (i-Dual Beam Focused Ion Beam) isetshenziswa kabanzi ocwaningweni nasekuhlolweni komkhiqizo kuzo zonke izinkambu ezifana nalezi:
Izinto ze-Ceramic,Ama-polymers,Izinto zensimbi,Izifundo zebhayoloji,Ama-semiconductors,I-Geology
Ububanzi besevisi
Izinto zokwakha ze-semiconductor, izinto ze-organic ezincane ze-molecule, izinto ze-polymer, i-organic/inorganic hybrid materials, izinto ezingaphili ezingezona ezensimbi
Isendlalelo Sesevisi
Ngokuthuthuka okusheshayo kobuchwepheshe be-semiconductor electronics kanye nobuchwepheshe besekethe obudidiyelwe, ubunkimbinkimbi obandayo bezakhiwo zedivayisi nesesekethe bukhuphule izidingo zokuxilonga inqubo ye-microelectronic chip, ukuhlaziya ukwehluleka, kanye nokwakhiwa kwe-micro/nano.Uhlelo lwe-Dual Beam FIB-SEM, ngamakhono ayo okunemba okunemba kanye nekhono lokuhlaziya i-microscopic, isiyinto ebaluleke kakhulu ekuklanyweni nasekukhiqizeni i-microelectronic.
Uhlelo lwe-Dual Beam FIB-SEMihlanganisa kokubili i-Focused Ion Beam (FIB) kanye ne-Scanning Electron Microscope (SEM). Inika amandla ukubonwa kwe-SEM yesikhathi sangempela sezinqubo ze-micromachining ezisekelwe ku-FIB, okuhlanganisa ukulungiswa kwendawo okuphezulu kwe-electron beam namandla okucubungula okunemba kwe-ion beam.
Izinto Zesevisi
Isayithi-Specific Cross-Section Ukulungiselela
TI-EM Imaging yesampula kanye nokuhlaziya
SI-Etching Etching noma Ukuhlola Okuthuthukisiwe Kwe-Etching
MI-etal kanye ne-Insulating Layer Deposition Testing
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Ucingo
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I-imeyili
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Phezulu