I-TEM Isingeniso

I-Transmission Electron Microscope (TEM) iyindlela yokuhlaziya isakhiwo se-microphysical esekelwe ku-electron microscopy esekelwe ku-electron beam njengomthombo wokukhanya, enokulungiswa okuphezulu okungaba ngu-0.1nm.Ukuvela kobuchwepheshe be-TEM kuthuthukise kakhulu umkhawulo wokubhekwa ngamehlo enqunu komuntu kwezakhiwo ezincane kakhulu, futhi iyithuluzi lokubuka le-microscopic elibalulekile emkhakheni we-semiconductor, futhi liyisisetshenziswa esibalulekile socwaningo nentuthuko, ukuqapha inqubo yokukhiqiza ngobuningi, kanye nenqubo. Ukuhlaziywa kwe-anomaly emkhakheni we-semiconductor.

I-TEM inohlu olubanzi kakhulu lwezinhlelo zokusebenza emkhakheni we-semiconductor, njengokuhlaziywa kwenqubo yokukhiqiza i-wafer, ukuhlaziya ukwehluleka kwe-chip, ukuhlaziywa kwe-chip reverse, ukuhlaziya kanye nokuhlaziywa kwenqubo ye-semiconductor, njll., isisekelo samakhasimende sigcwele izindwangu, izitshalo zokupakisha, izinkampani ze-chip design, ucwaningo nokuthuthukiswa kwemishini ye-semiconductor, ucwaningo nokuthuthukiswa kwezinto ezibonakalayo, izikhungo zocwaningo zasenyuvesi nokunye.

I-GRGTEST TEM Isingeniso sekhono leqembu lobuchwepheshe
Ithimba lezobuchwepheshe le-TEM liholwa uDkt. Chen Zhen, futhi umgogodla wobuchwepheshe weqembu unolwazi olungaphezu kweminyaka emi-5 ezimbonini ezihlobene.Abagcini nje ngokuba nolwazi olucebile ekuhlaziyweni kwemiphumela ye-TEM, kodwa futhi nolwazi olucebile ekulungiseleleni isampula ye-FIB, futhi banamandla okuhlaziya ama-wafers enqubo angu-7nm nangaphezulu kanye nezakhiwo ezibalulekile zamadivayisi ahlukahlukene we-semiconductor.Njengamanje, amakhasimende ethu agcwele izindwangu zomugqa wokuqala wasekhaya, izimboni zokupakisha, izinkampani zokuklama ama-chip, amanyuvesi nezikhungo zocwaningo lwesayensi, njll., futhi aziwa kabanzi ngamakhasimende.